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    varistor 472 SUS

    Abstract: rpf22n10 Fairchild UL file MOS transistor UHC MOS AN75 AN-7514 C150 IAS150 RFP22N10 uis test
    Text: Single Pulse Unclamped Inductive Switching: A Rating System Application Note Failure Mechanisms Early Power MOSFET devices, not designed to be rugged, failed when the parasitic bipolar transistor indigenous to the vertical DMOS process turned on. Figure 1 shows a cross


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    AN-7514 varistor 472 SUS rpf22n10 Fairchild UL file MOS transistor UHC MOS AN75 AN-7514 C150 IAS150 RFP22N10 uis test PDF

    varistor 472 SUS

    Abstract: Transient Voltage Suppression Devices, Harris RFP22N10 355a transistor landis rpf22n10 IAS25 AN9321 C150 IAS150
    Text: Harris Semiconductor No. AN9321 Harris Power February 1994 SINGLE PULSE UNCLAMPED INDUCTIVE SWITCHING: A RATING SYSTEM Author: Harold Ronan Unexpected transients in electrical circuits are a fact of life. The most potentially damaging transients enter a circuit on


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    AN9321 SSD-450) varistor 472 SUS Transient Voltage Suppression Devices, Harris RFP22N10 355a transistor landis rpf22n10 IAS25 AN9321 C150 IAS150 PDF

    varistor 472 SUS

    Abstract: RFP22N10 rpf22n10 AN-7514 AN9321 C150 IAS150 Fairchild UL file MOS transistor transient overvoltages in 220V 355a transistor
    Text: Single Pulse Unclamped Inductive Switching: A Rating System Application Note orpoion, minctor, ngle lse ncla ped duce witch g: A ating sm Failure Mechanisms Early Power MOSFET devices, not designed to be rugged, failed when the parasitic bipolar transistor indigenous to the


    Original
    AN-7514 AN9321) varistor 472 SUS RFP22N10 rpf22n10 AN-7514 AN9321 C150 IAS150 Fairchild UL file MOS transistor transient overvoltages in 220V 355a transistor PDF

    AN-7514

    Abstract: varistor 472 SUS bt 2328 RFP22N10 rpf22n10 C150 IAS150
    Text: Single Pulse Unclamped Inductive Switching: A Rating System Application Note Title N93 bt nse cla ed uce itch :A ting sm utho Unexpected transients in electrical circuits are a fact of life. The most potentially damaging transients enter a circuit on the power source lines feeding the circuit. Power control and


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    PDF

    RFP22N10

    Abstract: varistor 472 SUS rpf22n10 Landis AN9321 C150 IAS150 VARISTOR TESTING INTERSIL IAS25
    Text: Single Pulse Unclamped Inductive Switching: A Rating System Application Note Unexpected transients in electrical circuits are a fact of life. The most potentially damaging transients enter a circuit on the power source lines feeding the circuit. Power control and


    Original
    PDF