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    D65012GF

    Abstract: d65031 d65012 NEC JAPAN d65632 nec 2401 D65022L d65632 d65013gf d65025l D65025
    Text: NEC ELECTRONICS INC. July 1999 TRQ-99-07-330 QUARTERLY ASIC RELIABILITY REPORT This report contains reliability data on the following Application-Specific Integrated Circuit families assembled by NEC Electronics Inc. in Roseville, California fabricated by NEC Japan or NEC Electronics Roseville as specified .


    Original     		PDF TRQ-99-07-330 D83901S1 320-pin D65012GF d65031 d65012 NEC JAPAN d65632 nec 2401 D65022L d65632 d65013gf d65025l D65025

    MARKING CODE N-CHANNEL MOS FIELD EFFECT TRANSISTOR

    Abstract: uPD65837 uPD65869 X17512 upd65839 RF Transistors Ceramic MARKING F25 marking code F302 535 D65841 uPD65851 X46358
    Text: Design Manual CMOS-8L Family CMOS Gate Array Ver. 5.0 Document No. A12158EJ5V0DM00 5th edition Date Published June 1999 N CP(K) 1997, 1998 Printed in Japan 1 [MEMO] 2 Design Manual A12158EJ5V0DM00 NOTES FOR CMOS DEVICES 1 PRECAUTION AGAINST ESD FOR SEMICONDUCTORS


    Original     		PDF A12158EJ5V0DM00 Semiconductor2/9044 MARKING CODE N-CHANNEL MOS FIELD EFFECT TRANSISTOR uPD65837 uPD65869 X17512 upd65839 RF Transistors Ceramic MARKING F25 marking code F302 535 D65841 uPD65851 X46358

    d65641gd

    Abstract: D65656 D65801GD D65806 D65808 D65640GC nec 44-pin LQFP d65611gb D65625GC d65626gf D65672GL
    Text: NEC ELECTRONICS INC. October 1999 TRQ-99-10-335 QUARTERLY ASIC RELIABILITY REPORT This report contains reliability data on the following application-specific integrated circuit families fabricated and assembled by NEC Japan BiCMOS-4/4A BiCMOS-5 ECL-2 ECL-3/3A/3B


    Original     		PDF TRQ-99-10-335 304-pin d65641gd D65656 D65801GD D65806 D65808 D65640GC nec 44-pin LQFP d65611gb D65625GC d65626gf D65672GL