A00960 Search Results
A00960 Price and Stock
MACOM MABA-009600-CF48A0BALUN TRANSFORMER |
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MABA-009600-CF48A0 | Bulk |
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Amphenol Technical Products International EX-HA009601PLS18X-501-95-2 2M CONNECTOR |
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EX-HA009601 |
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Amphenol Technical Products International EX-HA009602PLS18Y-501-95-2 2M CONNECTOR |
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EX-HA009602 |
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Amphenol Sine Systems C14610A00960015C146F MALE MODULE 9 POLE CRIMP |
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C14610A00960015 |
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MACOM MABA-009602-ES2BALUN TRANSFORMER |
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MABA-009602-ES2 | 1 |
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A00960 Datasheets Context Search
Catalog Datasheet | MFG & Type | Document Tags | |
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"USB Microcontrollers"
Abstract: AT89C5132
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AT89C5132 A00960 AT89C5132 "USB Microcontrollers" | |
TQFP-80
Abstract: AT83C51SND1C AT89C5131 T85C5121 JESD22-A101 JESD22-A110 Q100 TQFP80 TS16949 atmel 442
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AT83C51SND1C AT83C51SND1C TQFP-80 AT89C5131 T85C5121 JESD22-A101 JESD22-A110 Q100 TQFP80 TS16949 atmel 442 | |
atmel lot marking
Abstract: ATMEL 634 AT35500 transistor WL 431 atmel h 306 AT89C51SND1C JESD22-A110 Q100 flash "high temperature data retention" mechanism 0.35uM STI
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AT89C51SND1C AT89C51SND1C atmel lot marking ATMEL 634 AT35500 transistor WL 431 atmel h 306 JESD22-A110 Q100 flash "high temperature data retention" mechanism 0.35uM STI | |
MIL-STD-883 Method 3015.7
Abstract: atmel lot marking eeprom atmel 922 AT89C5114 breakdown gate oxide atmel 336 DYNAMIC RAM CROSS REFERENCE Atmel eeprom Cross Reference Atmel 434 Atmel AT35523 Product Reliability Test
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T8xC5121 T8xC5121 MIL-STD-883 Method 3015.7 atmel lot marking eeprom atmel 922 AT89C5114 breakdown gate oxide atmel 336 DYNAMIC RAM CROSS REFERENCE Atmel eeprom Cross Reference Atmel 434 Atmel AT35523 Product Reliability Test | |
MTBF calculation
Abstract: AT89C5131 T89C51CC02 JESD22-A110 TSS463 JESD22-A101 JESD22-A118 Q100 TS16949 AT89C5114
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T89C51CC02 T89C51CC02 MTBF calculation AT89C5131 JESD22-A110 TSS463 JESD22-A101 JESD22-A118 Q100 TS16949 AT89C5114 | |
AT89C5131
Abstract: JESD22-A118 T89C51CC01 T89C51AC2 JESD22-A101 Q100 T89C51AC2 TS16949 ATMEL package qualification
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T89C51AC2 T89C51AC2 AT89C5131 JESD22-A118 T89C51CC01 T89C51AC2 JESD22-A101 Q100 TS16949 ATMEL package qualification | |
T89C51RD2 Marking
Abstract: AT89C5114 AT89C5131 JESD22-A101 JESD22-A110 JESD22-A118 Q100 T89C5115 TS16949 flash "high temperature data retention" mechanism
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T89C5115 T89C5115 T89C51RD2 Marking AT89C5114 AT89C5131 JESD22-A101 JESD22-A110 JESD22-A118 Q100 TS16949 flash "high temperature data retention" mechanism | |
AT89C51RD2 -um
Abstract: AT89C51RD2 AT89C51E2 atmel package marking atmel at89c51ed2 AT89C51ED2 ATMEL 634 AT89C51ED2 UM AT89C5131 JESD22-A101
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AT89C51RD2 AT89C51ED2 AT89C51ED2 AT89C51RD2 -um AT89C51E2 atmel package marking atmel at89c51ed2 ATMEL 634 AT89C51ED2 UM AT89C5131 JESD22-A101 |