hyperterminal
Abstract: h8sx
Text: APPLICATION NOTE H8SX Family Boundary Scan: Usage Introduction This Application Note describes the use of the boundary scan function. See the Boundary Scan: Introduction and Boundary Scan: Application documents Renesas Application Notes for an overview of the boundary scan function.
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H8SX/1648
REJ06B0815-0100/Rev
hyperterminal
h8sx
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D1027
Abstract: 32-Bit Parallel-IN Serial-OUT Shift Register XAPP300 low cost eeprom programmer circuit diagram MAX7000S X300 XCR3128 XCR5128 XCR3064
Text: Application Note: CoolRunner , CPLDs CoolRunner In-System Programming ISP R XAPP300 (v1.1) February 15, 2000 JTAG Boundary-scan and ISP Terminology BC Boundary-scan Cell BSDL Boundary-scan Description Language BST Boundary-scan Test CPLD Complex Programmable Logic Device
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XAPP300
XCR3032/XCR5032
XCR3064/PXCR5064
XCR3128/XCR5128
D1027
32-Bit Parallel-IN Serial-OUT Shift Register
XAPP300
low cost eeprom programmer circuit diagram
MAX7000S
X300
XCR3128
XCR5128
XCR3064
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Matrix keyboard key code
Abstract: KEYBOARD SCAN keyboard matrix key scan keyboard c code Matrix keyboard HA0011E HT46
Text: HT48 & HT46 Keyboard Scan Program HT48 & HT46 Keyboard Scan Program ：HA0011E D/N Introduction The keyboard application used here is a 4◊4 keyboard array with 16 keys, each one having its own hexadecimal code. The keyboard scan program scans the rows and
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A0011E
0000H
1111H.
Matrix keyboard key code
KEYBOARD SCAN
keyboard matrix
key scan
keyboard c code
Matrix keyboard
HA0011E
HT46
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AVR32114
Abstract: TFT LCD AVR atmel 32AP7000 32AP7000 STK1000 2.4 lcd qvga 320x240 AVR Lcd block diagram LCD DISPLAY 320x240 COLOR 6 POL vga lcd driver tx09d71vm1cca tx09d71vm1cca vga tft lcd display
Text: AVR32114: Using the AVR32 LCD Controller Features • STN Panel Features - Single and Dual Scan Color and Monochrome LCD Panels - 4-bit Single Scan, 8-bit Single or Dual Scan, 16-bit Dual Scan • Interfaces - Up to 16 Gray Levels for Monochrome and Up to 4096 Colors for Color Panel
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AVR32114:
AVR32
16-bit
24-bit
32063B-AVR32-09/07
AVR32114
TFT LCD AVR
atmel 32AP7000
32AP7000
STK1000
2.4 lcd qvga 320x240
AVR Lcd block diagram
LCD DISPLAY 320x240 COLOR 6 POL
vga lcd driver tx09d71vm1cca
tx09d71vm1cca vga tft lcd display
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24 pin tft lcd pinout details
Abstract: AVR32114 24 pin stn lcd pinout details TFT LCD AVR avr32program STK1000 32AP7000 atmel 32AP7000 0X00400000 stn lcd 320x240
Text: AVR32114: Using the AVR32 LCD Controller Features • STN Panel Features Single and Dual Scan Color and Monochrome LCD Panels 4-bit Single Scan, 8-bit Single or Dual Scan, 16-bit Dual Scan • Interfaces Up to 16 Gray Levels for Monochrome and Up to 4096 Colors for Color Panel
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AVR32114:
AVR32
16-bit
24-bit
32063E-AVR32-07/08
24 pin tft lcd pinout details
AVR32114
24 pin stn lcd pinout details
TFT LCD AVR
avr32program
STK1000
32AP7000
atmel 32AP7000
0X00400000
stn lcd 320x240
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MAX17121e
Abstract: MAX17121 LCD TV T-con board 400 MAX17121ETG tft lcd monitor circuit diagram MAX17121ET lcd t-con circuit 200-I MAX17121ETG T
Text: 19-4936; Rev 0; 9/09 TION KIT EVALUA BLE IL AVA A Dual High-Voltage Scan Drivers for TFT LCD The MAX17121 includes two high-voltage level-shifting scan drivers for TFT panel integrated gate logic. Each scan driver has two channels that switch complementarily. The scan-driver outputs swing from +40V to -30V and
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MAX17121
24-pin,
MAX17121e
LCD TV T-con board 400
MAX17121ETG
tft lcd monitor circuit diagram
MAX17121ET
lcd t-con circuit
200-I
MAX17121ETG T
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Untitled
Abstract: No abstract text available
Text: The Perkin Elmer Optoelectronics LD2100 high performance digital line scan cameras set new performance standards in line scan imaging. Innovative design features provide ultra-high performance while offering the flexibility required for line scan imaging applications.
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LD2100
10-bit
RS-232
S-4096,
S-6144,
S-8192
800-775-OPTO
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SCAN182245A
Abstract: SCAN182373A SCAN182374A SCAN18245T SCAN182541A SCAN18373T SCAN18374T SCAN18540T SCAN18541T
Text: Boundary-Scan Circuitry The scan cells used in the Boundary-Scan register are one of the following two types depending upon their location Scan cell TYPE1 is intended to solely observe system data while TYPE2 has the additional ability to control system data See IEEE Standard 1149 1 Figure 10–11 for a further
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32-bit
SCAN182245A
SCAN182373A
SCAN182374A
SCAN18245T
SCAN182541A
SCAN18373T
SCAN18374T
SCAN18540T
SCAN18541T
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E28A
Abstract: J28A SCANPSC100F WA28D
Text: SCANPSC100F Embedded Boundary Scan Controller IEEE 1149.1 Support General Description Features The SCANPSC100F is designed to interface a generic parallel processor bus to a serial scan test bus. It is useful in improving scan throughput when applying serial vectors to
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SCANPSC100F
SCANPSC100F
PSC100F
E28A
J28A
WA28D
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PSC-100
Abstract: PSC100F
Text: SCANPSC100F Embedded Boundary Scan Controller IEEE 1149.1 Support General Description Features The SCANPSC100F is designed to interface a generic parallel processor bus to a serial scan test bus. It is useful in improving scan throughput when applying serial vectors to
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SCANPSC100F
SCANPSC100F
PSC100F
PSC-100
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5962-9475001QXA
Abstract: 5962-9475001QYA C1996 SCANPSC100F SCANPSC100FDMQB SCANPSC100FFMQB SCANPSC100FLMQB SCANPSC100FSC SCANPSC100FSCX SCANPSC100
Text: SCANPSC100F Embedded Boundary Scan Controller IEEE 1149 1 Support General Description Features The SCANPSC100F is designed to interface a generic parallel processor bus to a serial scan test bus It is useful in improving scan throughput when applying serial vectors to
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SCANPSC100F
SCANPSC100F
PSC100F
5962-9475001QXA
5962-9475001QYA
C1996
SCANPSC100FDMQB
SCANPSC100FFMQB
SCANPSC100FLMQB
SCANPSC100FSC
SCANPSC100FSCX
SCANPSC100
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M28B
Abstract: MS-013 SCANPSC100F SCANPSC100FSC
Text: Revised May 2000 SCANPSC100F Embedded Boundary Scan Controller IEEE 1149.1 Support General Description Features The SCANPSC100F is designed to interface a generic parallel processor bus to a serial scan test bus. It is useful in improving scan throughput when applying serial vectors to
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SCANPSC100F
SCANPSC100F
M28B
MS-013
SCANPSC100FSC
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colour tv kit circuit diagram
Abstract: colour television block diagram 3 ccd progressive scan Z9037112PSC basic television block diagram Z90376 Z90371 decoder tv ir v-chip PORT17
Text: Z90376 and Z90371 64 KWord TV Dual Scan Controller with Progressive & Standard Interlaced Scan PB005601-TVC1199 Product Block Diagram On-Screen Display Features • Progressive scan for sharp, clear images without 64K Words ROM or OTP DSP Core RAM ADC OSD
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Z90376
Z90371
PB005601-TVC1199
Z90376
16-bit
colour tv kit circuit diagram
colour television block diagram
3 ccd progressive scan
Z9037112PSC
basic television block diagram
Z90371
decoder tv ir
v-chip
PORT17
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C5000
Abstract: SSYA002C TMS320VC5420
Text: Application Report SPRA597 - November 1999 Using Boundary Scan on the TMS320VC5420 Clay Turner C5000 Applications Team ABSTRACT The Texas Instruments TI TMS320VC5420 DSP implements limited boundary scan capability with respect to standard IEEE 1149.1 boundary scan devices. This application report
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SPRA597
TMS320VC5420
C5000
TMS320VC5420
VC5420
SSYA002C)
SSYA002C
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XDS510USB
Abstract: XDS510USB PLUS JTAG EMULATOR
Text: DiaTem Documentation DiaTem Debugger User’s guide Boundary Scan Test Software for TI DSPs Application Scan chain test and debug Boundary Scan Test of devices during board bring up Production board testing Warranty: 90 Days on Media and 1 year on Software.
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XDS510USB
tesS510USB
2000/XP
07dbd22d201292dc9e1e64ce3a947ba7
XDS510USB PLUS JTAG EMULATOR
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BS-CAN1 .24
Abstract: 4000ZE LC4128ZE-5TN100C RD1001 LFXP2-5E-5M132C LFXP2-5E-5M
Text: BSCAN1 – Multiple Scan Port Addressable Buffer January 2010 Reference Design RD1001 Introduction BSCAN1 is a multiple boundary scan test access port TAP addressable buffer function that can be accessed through a standard IEEE 1149.1 interface. With three Local Scan Ports (LSP), the BSCAN1 function can be structured as hierarchical ports with the ability to add and remove local scan chains to improve test throughput. The LSP
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RD1001
1-800-LATTICE
BS-CAN1 .24
4000ZE
LC4128ZE-5TN100C
RD1001
LFXP2-5E-5M132C
LFXP2-5E-5M
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Untitled
Abstract: No abstract text available
Text: SCANPSC100F SCANPSC100F Embedded Boundary Scan Controller IEEE 1149.1 Support Literature Number: SNOS134C SCANPSC100F Embedded Boundary Scan Controller (IEEE 1149.1 Support) General Description Features The SCANPSC100F is designed to interface a generic parallel processor bus to a serial scan test bus. It is useful in
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SCANPSC100F
SCANPSC100F
SNOS134C
PSC100F
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Untitled
Abstract: No abstract text available
Text: Boundary Scan Test Interface 11.0 Boundary Scan Test Interface The boundary-scan interface conforms to the IEEE Std. 1149.1- 1990, Standard Test Access Port and Boundary-Scan Architecture please refer to this standard for an explanation of the terms used in this
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OCR Scan
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Untitled
Abstract: No abstract text available
Text: a l February 1996 Semiconductor SCAN PSC1 OOF Embedded Boundary Scan Controller IEEE 1149.1 Support General Description Features The SCANPSC100F is designed to interface a generic par allel processor bus to a serial scan test bus. It is useful in improving scan throughput when applying serial vectors to
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OCR Scan
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SCANPSC100F
PSC100F
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ground nut seed
Abstract: No abstract text available
Text: SN54ABTH18502A, SN54ABTH182502A, SN74ABTH18502A, SN74ABTH182502A, SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SCBS164C - AUGUST 1993 - REVISED JULY 1996 One Boundary-Scan Cell Per I/O Architecture Improves Scan Efficiency SCOPE Instruction Set
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SN54ABTH18502A,
SN54ABTH182502A,
SN74ABTH18502A,
SN74ABTH182502A,
18-BIT
SCBS164C
ABTH182502A
ground nut seed
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TS3 Philips
Abstract: No abstract text available
Text: Philips Semiconductors Preliminary specification Progressive scan-Zoom and Noise reduction IC PROZONIC SAA4990H FEATURES GENERAL DESCRIPTION • Progressive scan conversion (262.5 to 525 or 312.5 to 625 lines/field) The Progressive scan-Zoom and Noise reduction IC,
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SAA4990H
SAA4951WP
SAA4952H
SAA7158WP
SAA4995WP
SAA4970T
711002b
TS3 Philips
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L64000
Abstract: P19C cy7c516 P15 Package TSE 151 L64017 MPY016K C2441 LSP3130
Text: L64016 L64Q17 16-Bit HCMOS Multipliers Preliminary Description V LSI LOGIC 4 0 8 .4 3 3 .8 0 0 0 Telex 172153 any A ?/ 005784 In the 68-pin versions, the L64016 and L64017 con tain on-chip scan testing. Normally non-connected pins are used for scan input, scan output and scan enable.
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L64016
L64017
16-Bit
L64017
16x16-bit
L64000
P19C
cy7c516
P15 Package
TSE 151
MPY016K
C2441
LSP3130
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Combined LC T-filter
Abstract: processor hbt 00 04 g SAA4951WP SAA4970T SAA4990H SAA4995WP SAA7158WP SAA4952H
Text: Philips Semiconductors Preliminary specification Progressive scan-Zoom and Noise reduction 1C PROZONIC SAA4990H FEATURES GENERAL DESCRIPTION • Progressive scan conversion (262.5 to 525 or 312.5 to 625 lines/field) The Progressive scan-Zoom and Noise reduction IC,
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OCR Scan
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SAA4990H
SAA4951WP
SAA4952H
SAA7158WP
SAA4995WP
711Qfl2b
01104Lb
Combined LC T-filter
processor hbt 00 04 g
SAA4970T
SAA4990H
SAA4952H
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teradyne tester test system
Abstract: No abstract text available
Text: February 1996 Semiconductor SCAN EASE SCAN Embedded Application Software Enabler General Description Features National Semiconductor SCAN EASE, a suite of software tools, enables ATPG or custom generated test vectors to be embedded within an IEEE 1149.1 compatible system, ad
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OCR Scan
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TL/F/12120-3
teradyne tester test system
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