690b
Abstract: No abstract text available
Text: Miniature Panel Mount Optical Encoder Reliability Data HRPG Series Description The following cumulative test results have been obtained from testing performed at HewlettPackard Optoelectronics Division in accordance with the latest revision of MIL- STD-883.
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STD-883.
MIL-STD-883C
5965-3479E
5966-2489E
690b
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MTTF
Abstract: No abstract text available
Text: Silicon Bipolar Variable Gain Amplifiers Reliability Data IVA Series Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-883. Data was gathered from the
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MIL-STD-883.
DOD-HDBK-1686
MIL-STD-202,
MTTF
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IAM-82018
Abstract: IAM82018 IVA05218 M2016 M2004 IVA-05218
Text: Silicon Bipolar Vector Modulator Reliability Data HPMX-2003/5 Series Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-883. Data was gathered from the
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HPMX-2003/5
MIL-STD-883.
MIL-STD-883
M1010
M1011
M2004
M2016
MIL-STD-202,
DOD-HDBK-1686
IAM-82018
IAM82018
IVA05218
M2016
M2004
IVA-05218
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IAM-8XXXX
Abstract: MTTF
Text: Silicon Bipolar Active Mixer Reliability Data IAM-8XXXX Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-883. Data was gathered from the product qualification, reliability
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MIL-STD-883.
DOD-HDBK-1686
MIL-STD-202,
IAM-8XXXX
MTTF
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JESD22 A108-B
Abstract: No abstract text available
Text: Agilent HDSM-425G 0.4" Dual Digit Green Surface Mount Seven Segment Display Reliability Data Sheet Description The following cumulative test results have been obtained from testing performed at Agilent Technologies in accordance with the latest revision of MIL-STD-883.
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HDSM-425G
MIL-STD-883.
pac000
5988-8922EN
JESD22 A108-B
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HEDS-9700
Abstract: No abstract text available
Text: Small Optical Encoder Modules Reliability Data HEDS-9700 Series Description The following cumulative test results have been obtained from testing performed at HewlettPackard Optoelectronics Division in accordance with the latest revision of MIL- STD-883. Hewlett-Packard tests parts at
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HEDS-9700
STD-883.
MIL-STD-883C
5091-5076E
5965-2832E
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class 5 examination
Abstract: MIL-M-38535
Text: Military Program Overview Corporate Philosophy MIL-STD-883 Compliance Lattice Semiconductor Corporation LSC is committed to leadership in device performance and quality. Our family of military ispLSI, pLSI and GAL devices is a reflection of this philosophy. LSC manufactures all devices under
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MIL-STD-883
MIL-I-38535
MIL-I-45208.
class 5 examination
MIL-M-38535
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X24C04DMB
Abstract: X24C16DMB 5962-8751403 Xicor 5962-8852506 X24C16DM 5962-8852506 smd code marking yx 60395 xicor 5962-8959001PX X24C16D
Text: Military Program Overview Xicor Military Program Overview cost to the customer and to assure full compliance with the requirements of MIL-STD-883, Xicor will, on occasion, respond with waiver requests. Xicor must review and accept a customer source control drawing prior to
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MIL-STD-883,
X28C513EMB-25
X28C513EMB-20
X28C513EMB-15
X28C513EMB-12
5962-9552504MRX
X24C04DMB
X24C16DMB
5962-8751403
Xicor 5962-8852506
X24C16DM
5962-8852506
smd code marking yx
60395 xicor
5962-8959001PX
X24C16D
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ispLSI 1015
Abstract: MIL-M-38535 class 5 examination "lattice semiconductor"
Text: Military Program Overview Corporate Philosophy MIL-STD-883 Compliance Lattice Semiconductor Corporation LSC is committed to leadership in device performance and quality. Our family of military ispLSI , pLSI® and GAL® devices is a reflection of this philosophy. LSC manufactures all devices under
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MIL-STD-883
MIL-I-38535
MIL-I-45208.
ispLSI 1015
MIL-M-38535
class 5 examination
"lattice semiconductor"
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mil-m-38535
Abstract: ispLSI 1015
Text: Military Program Overview Corporate Philosophy MIL-STD-883 Compliance Lattice Semiconductor Corporation LSC is committed to leadership in device performance and quality. Our family of military ispLSI and GAL® devices is a reflection of this philosophy. LSC manufactures all devices under strict
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MIL-STD-883
MIL-I-38535
MIL-I-45208.
MIL-STD-883mp.
mil-m-38535
ispLSI 1015
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MIL-M-38535
Abstract: No abstract text available
Text: Military Program Overview Corporate Philosophy MIL-STD-883 Compliance Lattice Semiconductor Corporation LSC is committed to leadership in device performance and quality. Our family of military ispLSI , pLSI® and GAL® devices is a reflection of this philosophy. LSC manufactures all devices under
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MIL-STD-883
MIL-I-38535
MIL-I-45208.
MIL-M-38535
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5965-7846E
Abstract: No abstract text available
Text: T-13/4 5 mm High Performance AlInGaP Amber, Red and Reddish-Orange Plastic Lamps Reliability Data Description The following cumulative test results have been obtained from testing performed at HewlettPackard Optoelectronics Division in accordance with the latest revisions of MIL- STD-883 and JIS C
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T-13/4
STD-883
5965-3111E
5965-7846E
5965-7846E
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Untitled
Abstract: No abstract text available
Text: Integrated Resistor Lamps Reliability Data The following cumulative test results have been obtained from testing performed at HP Optoelectronics Division in accordance with the latest revision of MIL-STD-883. T-1 and T-1 3/4 Lamps, 5 V and 12 V Series. Subminiature Lamps
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MIL-STD-883.
5965-7733E
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Mil-Std-883 Wire Bond Pull Method 2011
Abstract: mil-std-883 mil-std-883 2015 MIL-STD883 MIL-STD-883 Method 2010 MIL-STD-883 method 2011 mil-std-883* 2015 centrifuge
Text: HOLT CERAMIC PACKAGE PROCESS OPTIONS I = Industrial Grade -40°C to +85°C M = Military Grade (- 55°C to +125°) T = High Temp Grade (-55°C to +125°C) DSCC = Mil-STD-883 Compliant PROCESS FLOW PROCESS STEP I T M DSCC COMMENTS X X X X INCOMING WAFER INSPECTION
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Mil-STD-883
MIL-STD-883,
Mil-Std-883 Wire Bond Pull Method 2011
mil-std-883 2015
MIL-STD883
MIL-STD-883 Method 2010
MIL-STD-883 method 2011
mil-std-883* 2015
centrifuge
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65608E
Abstract: 5962-89598 SMDJ M65608E MMC9-65608EV-30 MMC9-65608EV-45 MMDJ-65608EV-30 MMDJ-65608EV-45 SB324 sb32
Text: Features • Operating voltage: 5V • Access time: 30, 45ns • Very low power consumption • • • • • • • • – active: 250mW Typ – standby: 1 µW (Typ) – data retention: 0.5 µW (Typ) Wide temperature Range: -55°C to +125°C 400Mils width package
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250mW
400Mils
M65608E
65608E
5962-89598
SMDJ
MMC9-65608EV-30
MMC9-65608EV-45
MMDJ-65608EV-30
MMDJ-65608EV-45
SB324
sb32
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SMDJ-65609EV-40SV
Abstract: M65609E MMDJ-65609EV-40 MMDJ-65609EV-40-E MMDJ-65609EV-40MQ
Text: Features • Operating voltage: 3.3V • Access time: 40ns • Very low power consumption • • • • • • • • – active: 180mW Max – standby: 70µW (Typ) Wide temperature Range: -55°C to +125°C 400 Mils width package TTL compatible inputs and outputs
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180mW
200Krads
M65609E
SMDJ-65609EV-40SV
MMDJ-65609EV-40
MMDJ-65609EV-40-E
MMDJ-65609EV-40MQ
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Untitled
Abstract: No abstract text available
Text: an A M P com pany Matched SPST RF Switch 20-1500 MHz SW-161 V3.00 DI-1 Features • • • • 0.87 Internally Terminated Integrated TTL Driver Low Loss: 0.8 dB typ. MIL-STD-883 Screening Available Guaranteed Specifications* Frequency Range Insertion Loss
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MIL-STD-883
SW-161
dB800)
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MIL-Q-9859
Abstract: No abstract text available
Text: seeo MIL-STD-883 Class B Compliant Product Processing SEEQ's Management emphasis is on Quality in products and performance, converting the results of the Technology evolution and innovations to the greatest benefit of our customers with an ever increased degree of system reliability, quality,
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MIL-STD-883
MIL-Q-9859,
MIL-l-45208,
MIL-M-38510
MIL-STD-45662
FED-STD-209.
MIL-Q-9859
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Untitled
Abstract: No abstract text available
Text: Military Program Overview Corporate Philosophy MIL-STD-883 Compliance Lattice Sem iconductor C orporation LSC is com m itted to leadership in device perform ance and quality. O ur fam ily of m ilitary ispLSt, pLSI and G AL devices is a reflection of this philosophy. LSC m anufactures all devices under
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IL-l-38535
IL-l-45208.
MIL-STD-883
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Hp 2564
Abstract: DOD-HDBK-1686
Text: warn H E W L E T T miCM P A C K A R D Silicon Bipolar RFIC 900 MHz Driver Amplifier Reliability Data HPMX-3002 Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the relevant MIL-STD-883 or HP inter
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HPMX-3002
MIL-STD-883
DOD-HDBK-1686
MIL-STD-202,
Hp 2564
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Untitled
Abstract: No abstract text available
Text: vwáK J T aan n AMP P ico m pa n y Matched SPST RF Switch 20-1500 MHz DI-1 Features • • • • SW-161 0.87 Internally Term inated Integrated TTL Driver Low Loss: 0.8 ctB typ. MIL-STD-883 Screening Available Guaranteed Specifications* Frequency Range Insertion Loss
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MIL-STD-883
SW-161
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qlmp
Abstract: QLMP-J qlmp-k MTL-HDBK-217
Text: What HEW LETT* mLlíM P A C K A R D T-l 3 mm High Performance AlInGaP Plastic Lamps Reliability Data Description QLMP-J2XX QLMP-J3XX QLMP-NLXX QLMP-K4XX QLMP-J5XX QLMP-KHXX QLMP-KLXX qlm p -n 4x x sions of MIL- STD-883 and JIS C 7021. you obtain from HP parts depends
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STD-883
5965-7847E
59684125E
qlmp
QLMP-J
qlmp-k
MTL-HDBK-217
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Untitled
Abstract: No abstract text available
Text: jM Â g ô M m an A M P com pany Matched SP3T RF Switch 20-1500 MHz SW-163 V2.00 Features DI-2 • In tern ally T e rm in a te d • • In teg ral TTL D river Low Loss - 0.9 dB Typical • MIL-STD-883 S creen in g A vailable Guaranteed Specifications* Dimensions in are in mm.
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MIL-STD-883
SW-163
SW-163
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method 2010 checklist
Abstract: 88C681 68C681 L-567 88C681 equivalent L567
Text: MILITARY PRODUCTS DOCUMENTATION SYSTEMS Documentation System s also reviews customer specifications and purchase orders and generates customized internal travelers to assure compliance to customer requirements. Documentation Systems maintains a program to
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68C681,
88C681,
82C684
method 2010 checklist
88C681
68C681
L-567
88C681 equivalent
L567
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