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    5962-8766106XA

    Abstract: 5962-8766102XA qml-38535 V05 SMD CODE MARKING 5962-8766101xa SMJ27C128-20JM
    Text: REVISIONS LTR DESCRIPTION DATE YR-MO-DA APPROVED Added Arrhenius equation for unbiased bake under margin test method A, back end margin test step C. Corrected military part numbers for device types 01 and 02. Technical changes made to 1.2.2, table I, figure 1, figure 2, figure 4, figure 5, 4.3.1, and table II. Added vendor


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    md27c128

    Abstract: L27C128 AM27C128-150/BXA ma550 SMJ27C128-20JM 27C128 INTEL 5962-8766106XX TI 27C128 uveprom D-10 MD27C128-20
    Text: REVISIONS LTR DESCRIPTION DATE YR-MO-DA A Added Arrhenius equation for unbiased bake under margin test method A, back end margin test step C. Corrected military part numbers for device types 01 and 02. Technical changes made to 1.2.2, table I, figure 1, figure 2, figure 4, figure 5,


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    Abstract: No abstract text available
    Text: AMD £ 1 R E V IS IO N S LTR DATE YR-MO-DA DESCRIPTION AiUml /Vrhpniir. «'*<|ua t i on tnr unbiased hake under marqin test K f ' l m a A, back end iM r q in te st step i. C orr ec te d m i l i t a r y ¡;fjr-t numbers for d evi ce types 01 ana 0 2 , Technical channes


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