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    uPD70216

    Abstract: uPD74HC1 32MSDRAM
    Text: SELF REFRESH DRAM 1994, 1996 Document No. M11500EJ2V0AN00 2nd edition (Previous No. IEA-1300) Date Published August 1996 P Printed in Japan NOTES FOR CMOS DEVICES 1 PRECAUTION AGAINST ESD FOR SEMICONDUCTORS Note: Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and


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    M11500EJ2V0AN00 IEA-1300) uPD70216 uPD74HC1 32MSDRAM PDF