Untitled
Abstract: No abstract text available
Text: Reliability Test TEST ITEM 1.TEMPERATURE CYCLE TC 2. HIGH TEMP. STORAGE (HTS) 3.LOW TEMP. STORAGE (LTS) 4.MOISTURE RESISTANCE (MR) 5.PRESSURE COOKER TEST (PCT) 6.SOLDERABILITY TEST (ST) TEST METHOD MIL-STD (1)MIL-STD-883D 1010.C0ND.C (2)JIS C7021 A-4 (1)MIL-STD-750B1031
|
Original
|
PDF
|
MIL-STD-883D
C7021
MIL-STD-750B1031
MIL-STD-750B1021
C7021B-11-C
EIAJ-IC-121
MIL-STD-883D2003
|
EIAJ-SD-121
Abstract: JIS C7021 B10 EIAJ SD-121 C7021 EE-SX1041
Text: Reliability • Market Product Quality OMRON is making efforts so that OMRON’s Photomicrosensors can achieve a failure rate of only 10–7/h. OMRON will continue improving the quality of its products to comply with OMRON Photomicrosensors users’ demand for product quality while
|
Original
|
PDF
|
|
EE-SX4019-P
Abstract: EE-CF4 EE-SX4019 EE-CF2 EIAJ-SD-121 EIAJ SD-121 EE-SX1235-P2 ee-sx307 EE-SX1018 C7021
Text: Product Quality Control and Reliability Product Quality Control Basic Policy of Product Quality Control OMRON has been attaching great importance to quality control of its products, with the view of making a contribution to society by producing high-quality products. The table below shows the contents of OMRON’s quality control system including marketing surveys and quality control
|
Original
|
PDF
|
st0033
EE-SX298*
EE-SX4009-P*
EE-SX301
EE-SX401
EE-SX4019-P
EE-CF4
EE-SX4019
EE-CF2
EIAJ-SD-121
EIAJ SD-121
EE-SX1235-P2
ee-sx307
EE-SX1018
C7021
|
JIS C7021 B-11
Abstract: 2SA1576A 2SA1774 2SC2412K 2SC4081 2SC4617 C7021 H63A
Text: Quality assurance and reliability Transistors Quality assurance and reliability !Quality Assurance Measures JIS Japan Industrial Standards defines reliability to be “the ability for an item to perform a required function under given conditions for a specified time”. This can be
|
Original
|
PDF
|
1000h
JIS C7021 B-11
2SA1576A
2SA1774
2SC2412K
2SC4081
2SC4617
C7021
H63A
|
JIS C7021 A-11
Abstract: 741J tlp655 EIAJ ED-4701 B-121 EIAJ ED-4701 B-131 TLP641G EIAJ ED-4701 B-123 TLP641J TLP666 TLP721
Text: [8] 7. ⸃ ⺑ ᶏᄖోⷙᩰቯࡈࠜ࠻ࠞࡊ ᒰ␠ߢߪޔUL USA ޔVDE (࠼ࠗ࠷)ޔBSI (⧷࿖)ޔSEMKO (ࠬ࠙ࠚ࠺ࡦ) ߩቯຠࠍ࠻ࡦࠫࠬ࠲ ജ࠲ࠬࠗࠨޔജࠢ࠶ࠕࠗ࠻ޔജߩ⒳ߩޘຠ⒳ߦࠊߚࠅࠗࡦࠕ࠶ࡊߒߡ߹ߔࠣࡦ࠴࠶ࠗࠬޕ
|
Original
|
PDF
|
VDE0884
TLP521-1
TLP531/532
TLP541G/545J
TLP550/551
TLP560G/561G
TLP620/-2/-4
TLP621/-2/-4
TLP750/751
TLP631/632
JIS C7021 A-11
741J
tlp655
EIAJ ED-4701 B-121
EIAJ ED-4701 B-131
TLP641G
EIAJ ED-4701 B-123
TLP641J
TLP666
TLP721
|
7 SEGMENT DISPLAY ALPHANUMERIC
Abstract: 16x16 LED Matrix JIS C7021 B-11 C7021 full color dot matrix 8 x 8 18 pin Dual alphanumeric, 16 segment display BLUE 4 DIGIT 7 SEGMENT LED DISPLAY AA-11X11
Text: Spark LED Lighting HK Co. Ltd. Room 1502, 15/F, New Treasure Centre, 10 Ng Fong Street, San Po Kong, Kowloon, Hong Kong Tel: 852-35201441 Fax: 852-35201449 [email protected] www.sparkledlighting.com.hk Display Specification – General Information
|
Original
|
PDF
|
MIL-STD-750
MIL-STD-883
C7021
160mA/duty
1000HRS
-24HRS,
72HRS)
008-8mm
028-28mm
180180mm
7 SEGMENT DISPLAY ALPHANUMERIC
16x16 LED Matrix
JIS C7021 B-11
full color dot matrix 8 x 8
18 pin Dual alphanumeric, 16 segment display
BLUE 4 DIGIT 7 SEGMENT LED DISPLAY
AA-11X11
|
EIAJ SD-121
Abstract: JIS-C-7021 JIS C7021 B-11 MIL-STD-750b JIS C7021 A-11 eiaj 5,5 3,4 1,0 JIS C7021 A-6 C7021 JIS C7021
Text: 半導体製品の信頼性について [6] [ 6 ] 半導体製品の信頼性について 1. 品質保証体系 半導体素子に対する品質と信頼性はそれが産業機器は言うにおよばず、日常の生活にとっても、ます ます密接な関係をもち重要なものとなっています。
|
Original
|
PDF
|
2SC1815
EIAJ SD-121
JIS-C-7021
JIS C7021 B-11
MIL-STD-750b
JIS C7021 A-11
eiaj 5,5 3,4 1,0
JIS C7021 A-6
C7021
JIS C7021
|
C7021
Abstract: PT600T C7035
Text: v r e DATE : ‘REP4RED BY: 2’ “-” 1 lsPECNO. DG-953054 1 / 1 1 PAGE ELECTRONIC COMPONENTS GROUP REP E E~TATIVE,DIVISION SHARP CORPORATION o SPECIFICATION -w, ? O u“DEVICES.~IV. {/tFl/{44tl/ “ ‘“ 4 “ ‘-> < \ ~ DEVICE SPECIFICATION FOR PHOTO-TRANSISTOR
|
Original
|
PDF
|
DG-953054
44tl/
PT60C
C7021
PT600T
C7035
|
ST-100SX
Abstract: MIL-STD-750b 100SX C5700 jis C5003 750H C5003 ST-100S YG6260 mosfet induction heater
Text: [ 4 ] Handling Guide for Semiconductor Devices [ 4 ] Handling Guide for Semiconductor Devices [ 4 ] Handling Guide for Semiconductor Devices 1. Using Toshiba Semiconductors Safely TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless,
|
Original
|
PDF
|
2SK1544
ST-100SX
MIL-STD-750b
100SX
C5700
jis C5003
750H
C5003
ST-100S
YG6260
mosfet induction heater
|
st-100sx
Abstract: Arakawa ST-100SX jis C5003 mosfet induction heater MIL-STD-750b 750H C5003 C5700 ST-100S YG6260
Text: [ 4 ] Handling Guide for Semiconductor Devices [ 4 ] Handling Guide for Semiconductor Devices [ 4 ] Handling Guide for Semiconductor Devices 1. Using Toshiba Semiconductors Safely TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless,
|
Original
|
PDF
|
2SK1544
st-100sx
Arakawa ST-100SX
jis C5003
mosfet induction heater
MIL-STD-750b
750H
C5003
C5700
ST-100S
YG6260
|
zener DIODE A112
Abstract: DC Motor control IGBT FUJI ELECTRIC ipm 7mbp75ra120 IGBT DRIVE 500V 300A 7MBP50RA120 application note 7MBP50RA06001 overcurrent circuit protection shock fuji ipm calculation of IGBT snubber TLP521-1GR
Text: FUJI POWER SEMICONDUCTORS IGBT-IPM R-SERIES APPLICATION MANUAL 1 REH983 CONTENTS Chapter 1 Features 1.1 IGBT-IPM Characteristics. 3 1.2 R-IPM Characteristics. 4
|
Original
|
PDF
|
REH983
zener DIODE A112
DC Motor control IGBT FUJI ELECTRIC ipm
7mbp75ra120
IGBT DRIVE 500V 300A
7MBP50RA120 application note
7MBP50RA06001
overcurrent circuit protection shock
fuji ipm
calculation of IGBT snubber
TLP521-1GR
|
Omron
Abstract: Photomicrosensors dark detector application ,uses and working Automatic Voltage stabilizer 5 kw working of darlington photo transistor photo KW robot phototransistor microwaves EE-SX1018 garage door photoelectric EE-SX1041
Text: Photomicrosensors Technical Information Features of Photomicrosensors The Photomicrosensor is a compact optical sensor that senses objects or object positions with an optical beam. The transmissive Photomicrosensor and reflective Photomicrosensor are typical Photomicrosensors.
|
Original
|
PDF
|
X305-E-1
Omron
Photomicrosensors
dark detector application ,uses and working
Automatic Voltage stabilizer 5 kw
working of darlington photo transistor
photo KW robot
phototransistor microwaves
EE-SX1018
garage door photoelectric
EE-SX1041
|
EE-SX1018
Abstract: EE-SX1041 EE-SX1070 EE-SX198 EE-SY110 SX1042 SX199 phototransistor sensitive to red light EE-SG3 application EESK3W
Text: Photomicrosensors Technical Information Features of Photomicrosensors The Photomicrosensor is a compact optical sensor that senses objects or object positions with an optical beam. The transmissive Photomicrosensor and reflective Photomicrosensor are typical Photomicrosensors.
|
Original
|
PDF
|
JB301-E3-01
EE-SX1018
EE-SX1041
EE-SX1070
EE-SX198
EE-SY110
SX1042
SX199
phototransistor sensitive to red light
EE-SG3 application
EESK3W
|
TOCP155K
Abstract: JIS C7021 B-11 TOCP255K TOCP200K JIS D 4215 JIS F07 tocp100k TOFC200 TOFC200Q JIS F05
Text: 解 [4] [4] 解 1. 説 説 光伝送デバイス トスリンク の概要 光伝送デバイスあるいは光通信用デバイスと聞くとどのような半導体素子を思い浮かべるでしょうか。 ほとんどの方が、光ファイバを使用して数十キロメートルの長距離伝送およびデジタル信号で数百メガ
|
Original
|
PDF
|
OCP100K/155K
OCP200K/255K
OCP100PK/155PK
OCP200PK/255PK
PCK-201Q/202Q
OCP100QK/150QKTOCP200QK
OCP100XK/150XKTOCP200XK
TOCP155K
JIS C7021 B-11
TOCP255K
TOCP200K
JIS D 4215
JIS F07
tocp100k
TOFC200
TOFC200Q
JIS F05
|
|
|
JIS C7021
Abstract: JIS-C-7021 JIS C7021 B-10 JIS C 7021B-10 C7021A
Text: • Soldering Instructions Iron soldering with 1.5mm iron tip Dip and flow soldering Types Temperature of the soldering bath Maximum soldering time Distance from solder joint to case Temperature of soldering iron Maximum soldering time Distance from solder joint
|
OCR Scan
|
PDF
|
10OOhrs
1000hrs
p7021
C7021
C--25
30min-
30min
C7021
JIS C7021
JIS-C-7021
JIS C7021 B-10
JIS C 7021B-10
C7021A
|
Untitled
Abstract: No abstract text available
Text: K /D io d es pp pnp S « iiE ^ :ff flt 4 c o i ' T iiE ^ f i U t i (c o t ' T • ISttKp^cOtilStt \fi>tlt>tlit, OIj C b" ! ^ w,— t t i>\ Cftft', ^tt(7 TftUSt„ £ t£ g ift? T o nc-<n'9pnpf|i;:U:, » S « napS, fite (3) IH S tX flO T e S t/M ft'-i-S ftT ft tj,
|
OCR Scan
|
PDF
|
si500mA)
500mA)
ffl83fc&
400MHz)
00027/106B$
/10sB
0066/106B
|
Toshiba b9 grease
Abstract: grease toshiba b9 EIA and EIAJ standards for marking EIA and EIAJ standards IC 2 5/grease toshiba b9
Text: 5.1. Quality assurance program The quality and reliability of semiconductor elements are closely related and important to our daily lives as well as to industrial equip ment. In this section is explained the quality assurance program as shown in Fig. 1 and
|
OCR Scan
|
PDF
|
168Hrs
2SD1406
150V140V^
110V100V
70V60V50
168Hrs
500Hrs
500mA,
Toshiba b9 grease
grease toshiba b9
EIA and EIAJ standards for marking
EIA and EIAJ standards
IC 2 5/grease toshiba b9
|
JIS C7021 A-11
Abstract: No abstract text available
Text: Transistors Quality assurance and reliability Quality assurance and reliability •Q ua lity Assurance Measures JIS Japan Industrial Standards defines reliability to be “the ability for an item to perform a required func tion under given conditions for a specified time”. This
|
OCR Scan
|
PDF
|
|
JIS C7021 B-11
Abstract: No abstract text available
Text: Introduction Overview of manufacturing processes From the development stage through to the start of mass production, ROHM semiconductor devices are subject to multiple quality assurance verification tests to ensure that the final product will be reliable. Any product must pass all tests before mass production. At the start
|
OCR Scan
|
PDF
|
|
chip die npn transistor
Abstract: JIS C7021 B-11 JIS C7021 B-10
Text: Introduction Quality assurance and reliability Quality assurance is defined in the JIS Japanese Industrial Standards as “the capability of an item to perform a required function under given conditions for an established period of time,” and can be expressed quantitatively in terms of failure rates and reliability levels.
|
OCR Scan
|
PDF
|
|
2SC1254
Abstract: JIS C7021 B-11 led Concave RS510
Text: LED Structure, Characteristics and Operation | CHARACTERISTICS I LED BASIC STRUCTURE T h e LED Light E m itting Diode chip h as an internal P-N junction, and an electrode is provided on each surface of the chip to m ake ohm ic contact. T he P-N junction is form ed by
|
OCR Scan
|
PDF
|
C7021
90-degree
JIS-C7021
2SC1254
JIS C7021 B-11
led Concave
RS510
|
Untitled
Abstract: No abstract text available
Text: 5. Reliability of s e m i c o n d u c t o r s S .l. Q uality assurance program The quality and reliability of semiconductor elements are closely related and important to our daily lives as well as to industrial equip ment. In this section is explained the quality
|
OCR Scan
|
PDF
|
2SD1406
168Hrs
500Hrs
1000Hrs
|
ATI Research
Abstract: MIL-STD-750b
Text: Reliability of semiconducto in a sta b ilized condition. T he ab ility of p ro d u c tion p ro cesses is confirm ed and p rio rity item s a re estab lish ed to rea lize ideal pro cess control, th u s p av in g th e w ay fo r su b se q u en t m ass p ro
|
OCR Scan
|
PDF
|
168Hrs
500Hre
2SK643
500H-S
100n-
500Hrs
700650J,
ATI Research
MIL-STD-750b
|
Toshiba Power and Industrial Semiconductors
Abstract: toshiba lot traceability
Text: Quality Assurance Quality and Reliability Assurance In recent years, technical revolutions have become alm ost a daily occurrence in the electronics industry. This is accompanied by the increasing application of semiconductors in both the consumer and industrial sectors, and dem ands for higher quality and higher reliability.
|
OCR Scan
|
PDF
|
FP144
Assurance-26
Toshiba Power and Industrial Semiconductors
toshiba lot traceability
|