Untitled
Abstract: No abstract text available
Text: Silicon Technology Reliability www.vishay.com Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size 18 368 Equivalent Device Hours 2 954 669 261 Failure Rate in FIT 2.505 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,
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Original
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JESD85,
23-Apr-12
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PDF
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Untitled
Abstract: No abstract text available
Text: Silicon Technology Reliability Vishay Siliconix BCD-18 TECHNOLOGY ACCELERATED OPERATING LIFE TEST RESULT Sample Size Equivalent Device Hours Failure Rate in FIT 82 3 566 796 255.131 Failure Rate in FIT is calculated according to JEDEC standard JESD85, Methods for Calculating Failure Rates in Units of FITs,
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Original
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BCD-18
JESD85,
18-Nov-10
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PDF
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Untitled
Abstract: No abstract text available
Text: Silicon Technology Reliability www.vishay.com Vishay Siliconix P-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size 14 265 Equivalent Device Hours 2 779 173 437 Failure Rate in FIT 11.910 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,
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Original
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JESD85,
23-Apr-12
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PDF
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Silicon Technology Reliability
Abstract: silicon
Text: Silicon Technology Reliability www.vishay.com Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size 232 395 Equivalent Device Hours 28 904 254 900 Failure Rate in FIT 1.073 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,
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Original
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JESD85,
23-Apr-12
Silicon Technology Reliability
silicon
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PDF
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15-V
Abstract: SN74HSTL162822
Text: SN74HSTL162822 14-BIT TO 28-BIT HSTL-TO-LVTTL MEMORY ADDRESS LATCH SCES091A – DECEMBER 1996 – REVISED APRIL 1997 D D D D DGG PACKAGE TOP VIEW Member of the Texas Instruments Widebus Family Inputs Meet JEDEC HSTL Standard JESD8-6 All Outputs Have Equivalent 25-Ω Series
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Original
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SN74HSTL162822
14-BIT
28-BIT
SCES091A
15-V
SN74HSTL162822
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PDF
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Untitled
Abstract: No abstract text available
Text: SN74HSTL162822 14-BIT TO 28-BIT HSTL-TO-LVTTL MEMORY ADDRESS LATCH SCES091A – DECEMBER 1996 – REVISED APRIL 1997 D D D D DGG PACKAGE TOP VIEW Member of the Texas Instruments Widebus Family Inputs Meet JEDEC HSTL Standard JESD8-6 All Outputs Have Equivalent 25-Ω Series
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Original
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SN74HSTL162822
14-BIT
28-BIT
SCES091A
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PDF
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us1235
Abstract: No abstract text available
Text: Commercial/Industrial PEEL 22LV10AZ-25 / I-35 CMOS Programmable Electrically Erasable Logic Device Features • Low Voltage, Ultra Low Power Operation - Vcc = 2.7 to 3.6 V - Icc = 5 µA typical at standby - Icc = 1.5 mA (typical) at 1 MHz - Meets JEDEC LV Interface Spec (JESD8-B)
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Original
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22LV10AZ-25
22V10
inpu32-0815
04-02-037D
us1235
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PDF
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failure rate
Abstract: 313 equivalent
Text: Silicon Technology Reliability Vishay Siliconix ACCELERATED OPERATING LIFE TEST RESULT Sample Size 2,300 Equivalent Device Hours 313,492,812 Number of Total Failures Failure Rate in FIT 2.903 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,
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Original
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JESD85,
26-Jan-05
failure rate
313 equivalent
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PDF
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Untitled
Abstract: No abstract text available
Text: Silicon Technology Reliability Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size Equivalent Device Hours Failure Rate in FIT 12 045 2 965 913 412 0.307 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,
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Original
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JESD85,
28-Jul-08
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PDF
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Untitled
Abstract: No abstract text available
Text: Silicon Technology Reliability Vishay Siliconix ACCELERATED OPERATING LIFE TEST RESULT Sample Size Equivalent Device Hours Failure Rate in FIT 15 217 4 483 825 626 5.553 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,
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Original
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JESD85,
28-Jul-08
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PDF
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schottky diode FIT
Abstract: SCHOTTKY JESD85
Text: Silicon Technology Reliability Vishay Siliconix SCHOTTKY DIODE ACCELERATED OPERATING LIFE TEST RESULT Sample Size Equivalent Device Hours Failure Rate in FIT 410 46 028 658 19.770 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,
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Original
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JESD85,
28-Jul-08
schottky diode FIT
SCHOTTKY
JESD85
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PDF
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Silicon Technology Reliability
Abstract: 72476
Text: Silicon Technology Reliability Vishay Siliconix ACCELERATED OPERATING LIFE TEST RESULT Sample Size Equivalent Device Hours Failure Rate in FIT 2006 223 258 252 4.076 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,
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Original
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JESD85,
29-Jul-08
Silicon Technology Reliability
72476
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PDF
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Untitled
Abstract: No abstract text available
Text: Silicon Technology Reliability Vishay Siliconix ACCELERATED OPERATING LIFE TEST RESULT Sample Size 2,199 Equivalent Device Hours 166,604,213 Number of Total Failures Failure Rate in FIT 5.462 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,
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Original
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JESD85,
28-Jan-05
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PDF
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Untitled
Abstract: No abstract text available
Text: Silicon Technology Reliability Vishay Siliconix P-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size Equivalent Device Hours Failure Rate in FIT 65 642 9 758 753 655 3.392 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,
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Original
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JESD85,
28-Jul-08
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PDF
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|
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failure rate
Abstract: AN 308 FIT rate
Text: Silicon Technology Reliability Vishay Siliconix ACCELERATED OPERATING LIFE TEST RESULT Sample Size 308 Equivalent Device Hours 23,969,456 Number of Total Failures Failure Rate in FIT 38.0 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,
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Original
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JESD85,
22-Oct-03
failure rate
AN 308
FIT rate
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PDF
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72483
Abstract: No abstract text available
Text: Silicon Technology Reliability Vishay Siliconix ACCELERATED OPERATING LIFE TEST RESULT Sample Size Equivalent Device Hours Failure Rate in FIT 2296 248 147 113 3.667 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,
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Original
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JESD85,
28-Jul-08
18-Jul-08
72483
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PDF
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73884
Abstract: DSA003850
Text: Silicon Technology Reliability Vishay Siliconix P-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT 175 °C - AUTOMOTIVE Sample Size 574 Equivalent Device Hours 176,191,121 Number of Total Failures Failure Rate in FIT 5.165 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs, based on
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Original
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JESD85,
05-May-06
73884
DSA003850
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PDF
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jesd
Abstract: No abstract text available
Text: Silicon Technology Reliability Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT 175 °C - AUTOMOTIVE Sample Size 6,642 Equivalent Device Hours 3,229,012,514 Number of Total Failures Failure Rate in FIT 0.282 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs, based on
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Original
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JESD85,
05-May-06
jesd
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PDF
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72560
Abstract: Silicon Technology Reliability
Text: Silicon Technology Reliability Vishay Siliconix ACCELERATED OPERATING LIFE TEST RESULT Sample Size Equivalent Device Hours Failure Rate in FIT 850 112 368 583 8.098 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,
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Original
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JESD85,
29-Jul-08
72560
Silicon Technology Reliability
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PDF
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Silicon Technology Reliability
Abstract: 73889
Text: Silicon Technology Reliability www.vishay.com Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size 15 334 Equivalent Device Hours 6 915 815 331 Failure Rate in FIT 0.132 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,
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Original
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JESD85,
15-May-12
Silicon Technology Reliability
73889
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PDF
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Untitled
Abstract: No abstract text available
Text: Silicon Technology Reliability www.vishay.com Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size 41 117 Equivalent Device Hours 7 370 953 354 Failure Rate in FIT 2.401 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,
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Original
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JESD85,
23-Apr-12
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PDF
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Untitled
Abstract: No abstract text available
Text: Silicon Technology Reliability www.vishay.com Vishay Siliconix P-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size 64 088 Equivalent Device Hours 11 876 917 597 Failure Rate in FIT 2.442 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,
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Original
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JESD85,
23-Apr-12
|
PDF
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Untitled
Abstract: No abstract text available
Text: Preliminary Commercial PEEL 18LV8Z-25 CMOS Programmable Electrically Erasable Logic Device FEATURES • Low Voltage, Ultra Low Power Operation - Vcc = 2.7 to 3.6 V - Icc =25 uA typical at standby - Icc = 2 mA (typical) at 1 MHz - Meets JEDEC LV Interface Spec (JESD8-A)
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OCR Scan
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18LV8Z-25
20-Pin
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PDF
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Untitled
Abstract: No abstract text available
Text: SN74HSTL162822 14-BIT TO 28-BIT HSTL-TO-LVTTL MEMORY ADDRESS LATCH SCES091 A - D ECEM B E R 1996 - R EVISED A P R IL 1997 Member of the Texas Instruments Widebus Family DGG PACKAGE TOP VIEW Inputs Meet JEDEC HSTL Standard JESD8-6 1Q2 [ , 2Q1 [ 2 1Q1 [ 3
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OCR Scan
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SN74HSTL162822
14-BIT
28-BIT
SCES091
|
PDF
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