EM16383E Search Results

EM16383E Datasheets Context Search

Catalog Datasheet	MFG & Type	PDF	Document Tags
MAS-5010 Abstract: 53368 62212 ETS500 119185 Text: Hi-Rel Operations National Semiconductor Corporation Radiation Effects Laboratory South Portland, Maine 04106 ANALOG TOTAL DOSE RADIATION REPORT Customer: Rad Qual Part Type: RM2012XW-QMLV Input Bias Circuit: 6354IR Dose Rate: 37.878 rad Si /sec Test Program Used: EQR2012BA	Original	PDF	RM2012XW-QMLV 6354IR EQR2012BA EM16383E JCPAC010 7H4381G019 e-128 MAS-5010 53368 62212 ETS500 119185

Catalog Datasheet

MFG & Type

PDF

Document Tags

MAS-5010

Abstract: 53368 62212 ETS500 119185
Text: Hi-Rel Operations National Semiconductor Corporation Radiation Effects Laboratory South Portland, Maine 04106 ANALOG TOTAL DOSE RADIATION REPORT Customer: Rad Qual Part Type: RM2012XW-QMLV Input Bias Circuit: 6354IR Dose Rate: 37.878 rad Si /sec Test Program Used: EQR2012BA

Original

PDF

RM2012XW-QMLV 6354IR EQR2012BA EM16383E JCPAC010 7H4381G019 e-128 MAS-5010 53368 62212 ETS500 119185