transistor HR
Abstract: DS1669 1k39
Text: RELIABILITY MONITOR PRODUCT MONITOR DATE DATE CODE ASSEMBLY FACILITY ASSEMBLY LOT NO PROCESS TYPE PACKAGE TYPE DS1669 Feb-97 9647 B2 OMEDATA DD636105AAC 1.2µ OX/NI EEPROM 08 SOIC 208 STRESS/JOB NO. READPOINT Sample Size/No. of Fails Preconditioning (P/C):
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DS1669
Feb-97
DD636105AAC
P-19067
P-19128,
P-19259
P-19260
transistor HR
DS1669
1k39
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P-20606
Abstract: c19643 DS1868 p19500 p1908 DD642 P19-50 B59728 P2050
Text: RELIABILITY MONITOR STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V. DS1302 PRODUCT DS1302 DS1302 DS1302 DS1868 DS21S07A DS21S07A DS21S07A DS2401 DS2401 DS2401 DS80C320 DS80C320 DS80C320 DS80C320 MONITOR DATE JOB NO. Mar-97 Jun-97 Sep-97 Feb-97 Feb-97
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DS1302)
Mar-97
Jun-97
Sep-97
Feb-97
May-97
Aug-97
P-20606
c19643
DS1868
p19500
p1908
DD642
P19-50
B59728
P2050
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DS1868
Abstract: DL6-11 c19643 dallas date code ds12887 P1788 P-18182 dk52
Text: RELIABILITY MONITOR PRODUCT DS1302 DS1302 DS1302 DS1302 DS1868 DS21S07A DS21S07A DS21S07A DS21S07A DS21S07A DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V.SUMMARY DS1
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DS1302
DS1868
DS21S07A
DL6-11
c19643
dallas date code ds12887
P1788
P-18182
dk52
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DK53
Abstract: dk52 P-17422 P19500 P1908 P-17411 DN546229ATA DS1000M
Text: RELIABILITY MONITOR STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V. DS1302 PRODUCT MONITOR DATE DS1302 DS1302 DS1302 DS1868 DS21S07A DS21S07A DS21S07A DS21S07A DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 Mar-96 Sep-96
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PDF
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DS1302)
DS1302
DS1868
DS21S07A
DS80C320
DK53
dk52
P-17422
P19500
P1908
P-17411
DN546229ATA
DS1000M
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