CY100E494 Search Results

CY100E494 Datasheets (4)

Part	ECAD Model	Manufacturer	Description	Curated	Datasheet Type	PDF
CY100E494L-12DC		Cypress Semiconductor	16,384 x 4 ECL Static RAM		Scan	PDF
CY100E494L-12JC		Cypress Semiconductor	16,384 x 4 ECL Static RAM		Scan	PDF
CY100E494L-12KC		Cypress Semiconductor	16,384 x 4 ECL Static RAM		Scan	PDF
CY100E494L-12VC		Cypress Semiconductor	16,384 x 4 ECL Static RAM		Scan	PDF

CY100E494 Datasheets Context Search

Catalog Datasheet	MFG & Type	Document Tags	PDF
CY27S03A Abstract: 15JC10 CY7C190 cy7c9101 cy7c122 die VIC068A user guide Text: Thermal Management and Component Reliability slope of the logarithmic plots is given by the activation energy of the failure mechanisms causing thermally activated wear out of the device see Figure 1 . One of the key variables determining the long-term reliability	Original	CY7C122 CY27S03A 15JC10 CY7C190 cy7c9101 cy7c122 die VIC068A user guide	PDF
CY7C9101 Abstract: CY7C510 CY7C190 cy7c189 G30-88 CY7c910 EA 9394 cy3341 CY6116 cy7c901 Text: fax id: 8511 Thermal Management Thermal Management and Component Reliability One of the key variables determining the long-term reliability of an integrated circuit is the junction temperature of the device during operation. Long-term reliability of the semiconductor chip degrades proportionally with increasing temperatures following an exponential function described by the	Original		PDF
SSC 9101 Abstract: c494 223A10 Text: EbE D CYPRESS mg • ssa^bba 0004401 y ■ SEMICONDUCTOR CYPRESS . : PRELIM INARY i - •••••• ^ SEMICONDUCTOR T ^ U S -iO CY1E494 JÇŸÎ5SÎÎ1 CY100E494 ■ ■■ . 16,384 x 4 ECL Static RAM • Open em itter output for ease of memory expansion	OCR Scan	CY1E494 CY100E494 10KH/10K CY1E494, CY10E494 CY100E494 00a44fib CY10E494 SSC 9101 c494 223A10	PDF
Untitled Abstract: No abstract text available Text: CY10E494 CY100E494 CY101E494 CYPRESS SEMICONDUCTOR 16,384x4 ECL Static RAM Features • Capable o f w ithstanding >2001V E SD • 16,384 x 4 bits organization • Open emitter output for ease of memory expansion • Ultra high speed/standard power • Industry-standard pinout	OCR Scan	CY10E494 CY100E494 CY101E494 384x4 CY101E494 CY10E494L--12VC 494-10D 10E494--10KMB 10E494--12DM 10E494--12KMB	PDF
K74 PACKAGE DIAGRAM Abstract: IR 10e 1h Text: = ^~' _ = p r e l im in a r y . ^ SEMICONDUCTOR Features • CY10E494 CY100E494 CY101E494 16,384 x 4 bits organization • Ultra high speed/standard power — tAA = 7 ns — I f E — 180 mA 16,384 x 4 ECL Static RAM • Open emitter output for ease of	OCR Scan	10KH/10K- 100K-compatible CY10E494 CY100E494 CY101E494 CY101E494 10E494-7VC CY10E494-7K 10E494-7DC 10E494-8V K74 PACKAGE DIAGRAM IR 10e 1h	PDF
1r 10e Abstract: N25U Text: CY10E494 CY100E494 CY101E494 " 'Y P P F Ç Ç 1 6 ,3 8 4 x 4 ECL Static RAM SEMICONDUCTOR Features • 16,384 x 4 bits organization • Ultra high speed/standard power — tAA = 7 n s — IEK = 180 mA • Low-power version — tAA = 12 ns — I e e = Î35 mA	OCR Scan	CY10E494 CY100E494 CY101E494 10KH/10K- 100K-compatible CY101E494 CY10E494-7DC CY10E494-7KC CY10E494-- 1r 10e N25U	PDF
Untitled Abstract: No abstract text available Text: r CYPRESS SEMICONDUCTOR Features • Open em itter output for ease of memory expansion • 16,384 x 4 bits organization • Ultra high speed/standard power • — tAA = 7 ns Industry standard pinout Functional Description — IE E = 180 mA • CY1E494 CY10E494	OCR Scan	CY1E494 CY10E494 CY100E494 -/10K 100E494 1E494 494-7JC	PDF
CY7C2901 Abstract: No abstract text available Text: ÌB Ìcy p ress • Table 10. Die Sizes of Cypress Devices continued P a rt N um ber Size (mil2) P a rt N um ber Size (mil2) ECL Logic CY 2909A 7968 CY100E301L 14875 CY2910A 21750 CY100E302L 14875 CY2911A 7968 CY100E422 6960 11800 CY100E474 10830 CY7C510	OCR Scan	CY100E301L CY2910A CY100E302L CY2911A CY100E422 CY100E474 CY7C510 CY100E494 CY7C516 CY10E301L CY7C2901	PDF