54HC
Abstract: CD54HC4050 CD54HC4051 CD54HCT4051
Text: H ig h-R e lia b ility H ig h -S p e e d C M O S Logic ICs C D 54H C 4050/3A Static Electrical Characteristics L im its w ith b la c k d o ts (• are tested 100%) T E S T C O N D IT fO N S V,N H C /H C T C H A R A C T E R IS T IC S Q u iesce n t D evice C u rre n t
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CD54HC4050/3A
54HC
CD54HC4050
CD54HC4051
CD54HCT4051
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54HC
Abstract: CD54HC374 CD54HCT374
Text: High-Reliability High-Speed CMOS Logic ICs C D 54H C 373/3A C D 54H C T373/3A Switching Speed Limits with black dots (« are tested 100%.) SWITCHING CHARACTERISTICS (CL = 50 pF, Input 1„ t, = 6 ns) LIMITS TEST _ 25 >C 55°C to +125°C CONDITIO NS SYMBOL
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CD54HC373/3A
CD54HCT373/3A
54HCT
360/iA
54HC
CD54HC374
CD54HCT374
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CMOS 4060
Abstract: hc4060 HCT4060 CD54HC4060/3A CD54HC4060 54HC CD54HCT4060
Text: H ig h -R e lia b ility H ig h -S p e e d C M O S Logic IC s C D 54H C 4059/3A C D 54H C T4059/3A Switching Speed L im its w ith black dots (• are tested 100%.) SWITCHING CHARACTERISTICS (C L = 50 pF, Input t„ t, = 6 ns)
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CD54HC4059/3A
CD54HCT4059/3A
54HCT
CD54HC/HCT4060
2k-47k
D54HC4066/3A
CD54HCT4066/3A
CD54HC4066
CD54HCT4066
CD4066B.
CMOS 4060
hc4060
HCT4060
CD54HC4060/3A
CD54HC4060
54HC
CD54HCT4060
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t125 switch
Abstract: 54HC CD54HCT241
Text: High-Reliability High-Speed C M O S Logic ICs C D 54H C 240/3A C D 54H C T240/3A Switching Speed L im its w ith b la ck dots (• are tested 100%.) SWITCHING CHARACTERISTICS CHARACTERISTIC P ro p a g a tio n Delay D ata to O u tp u ts O u tp u t Enable and
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CD54HC240/3A
CD54HCT240/3A
54HCT
t125 switch
54HC
CD54HCT241
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54HC
Abstract: CD54HC147 CD54HCT147 aloe
Text: High-Reliability High-Speed CMOS Logic ICs C D 54H C 139/3A CD 54H C T139/3A Switching Sp€6d Limits with black dots (• are tested 100%.) SWITCHING CHARACTERISTICS (CL = SO pF, Input t„ t, = 6 ns) LIMITS TEST _ 55 C to +125 Í 25 ’ C CONDITIONS 54HCT
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CD54HC139/3A
CD54HCT139/3A
54HCT
CD54HC/HCT147
2k-47k
54HC
CD54HC147
CD54HCT147
aloe
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C4053
Abstract: 54HC CD54HC4052 CD54HCT4052
Text: High-Reliability High-Speed C M O S Logic ICs CD 54HC4051/3A C D 54H C T 4051/3 A Switching Speed Lim its with black dots (• are tested 100% ) SWITCHING CHARACTERISTICS (CL = 50 pF, Input t„ t, = 6 ns) Maximum Switch Turn “O ff" Delay from S or E to
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CD54HC4051/3A
CD54HCT4051/3A
54HCT
92CS-39533
C4053
54HC
CD54HC4052
CD54HCT4052
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54HC
Abstract: CD54HC244 CD54HCT244
Text: High-Reliability High-Speed C M O S Logic ICs C D 54HC243/3A CD 54H C T243/3A Switching Speed L im its w ith black d o ts (• are tested 100%.) SWITCHING CHARACTERISTICS (Cc = 50 pF, Input t„ t, = 6 ns) 25 3C C H A R A C T E R IS T IC SYMBOL P ro p a g a tio n D elay
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CD54HC243/3A
CD54HCT243/3A
54HCT
CD54HC/HCT244
CD54HC/HCT244
2k-47k
54HC
CD54HC244
CD54HCT244
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54HC
Abstract: CD54HCT4075
Text: High-Reliability High-Speed C M O S Logic ICs C D 54H C 4067/3A C D 54H C T4067/3A Switching Speed L im its w ith bla ck d o ts (• are tested 100%.) SWITCHING CHARACTERISTICS (CL = 50 pF, Input t„ t, = 6 ns) C H A R A C T E R IS T IC SYMBOL P ro p a g a tio n Delay
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CD54HC4067/3A
CT4067/3A
54HCT
CD54HC/HCT4075
CD54HC/HCT4075
2k-47k
54HC
CD54HCT4075
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54HC
Abstract: 54LS CD54HC534 CD54HCT534
Text: High-Reliability High-Speed C M O S Logic ICs C D 54H C 533/3A C D 54H C T533/3A Switching Speed L im its w ith bla ck d o ts (• are tested 100%.) SW ITCHING CHARACTERISTICS (C L = 50 pF, Input t„ t, = 6 ns) TEST LIMITS 25 ’ C CONDITIO NS -55° C to +125°
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CD54HC533/3A
CD54HCT533/3A
54HCT
2k-47k
CD54HC540/3A
CD54HCT540/3A
CD54HC540
CD54HCT540
92CS-39S4T
54HC
54LS
CD54HC534
CD54HCT534
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CD54HC4543
Abstract: CD54HCT4543 EG 64 hc 14 54HC resistor network for vme bus
Text: High-Reliability High-Speed CMOS Logic ICs C D 54H C 4538/3A C D 54H C T4538/3A Switching Speed L im its w ith b la ck d o ts (. are tested 100% ) SWITCHING CHARACTERISTICS (CL = 50 pF, Input t, t, = 6 ns) I CHARACTERISTIC SYMBOL V P ro p a g a tio n D elay
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CD54HC4538/3A
CD54H
CT4538/3A
54HCT
SCSI/Q-02
CD54HC4543
CD54HCT4543
EG 64 hc 14
54HC
resistor network for vme bus
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Untitled
Abstract: No abstract text available
Text: High-Reliability High-Speed C M O S Logic ICs CD54HC4049/3A Switching Speed L im its w ith b la ck d ots (• are tested 100%.) SWITCHING CHARACTERISTICS (CL = 50 pF, Input t„ t, CHARACTERISTIC SYMBOL P ro p a g a tio n D elay 25 ’ C HC Vcc V Min. tp H L
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CD54HC4049/3A
CD54HC4051/3A
CD54HCT4051/3A
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Untitled
Abstract: No abstract text available
Text: High-Reliability High-Speed CMOS Logic ICs CD54HC125/3A CD54HCT125/3A Switching Speed Lim its with black dots (• are tested 100%.) SWITCHING CHARACTERISTICS (C L = 50 pF, Input t„ ti = 6 TEST C ONDITIO NS
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CD54HC125/3A
CD54HCT125/3A
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Ct4538 application
Abstract: 5950 7 segment 54HC CD54HC4538 CD54HCT4538 ct453 CD54HCT4543 CD54HC4543
Text: High-Reliability High-Speed CMOS Logic ICs C D54HC4520/3A C D 54H C T4520/3A Switching Speed L im its w ith bla ck d o ts (» are tested 100 %.) SWITCHING CHARACTERISTICS (C L = 50 pF, Input t„ t, = 6 ns) 25 C CHARACTERISTIC SYMBOL tpLH tpHL Enable to Qn
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D54HC4520/3A
D54HCT4520/3A
54HCT
Tr54HC4543
CD54HCT4543
Ct4538 application
5950 7 segment
54HC
CD54HC4538
CD54HCT4538
ct453
CD54HC4543
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54HC
Abstract: CD54 CD54HC540 CD54HCT540
Text: High-Reliability High-Speed CMOS Logic ICs C D 54H C 534/3A C D 54H C T534/3A Switching Speed Limits with black dots (• are tested 100%.) SWITCHING CHARACTERISTICS (CL = 50 pF, Input tr, t, = 6 ns) TEST LIMITS _55“ C to +125°( C ONDITIONS 25 ’ C SYMBOL
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CD54HC534/3A
CT534/3A
54HCT
CD54HC/HCT540
CD54HC/HCT540
2k-47k
54HC
CD54
CD54HC540
CD54HCT540
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Untitled
Abstract: No abstract text available
Text: High-Reliability High-Speed CMOS Logic ICs CD54HC163/3A CD54HCT163/3A Switching Speed Limits with black dots (• are tested 100%.) SWITCHING CHARACTERISTICS (CL = 50 pF, Input 1„ t, = 6 ns) TEST CONDITIO NS CHARACTERISTIC SYMBOL Propagation Delay CP to TC
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CD54HC163/3A
CD54HCT163/3A
CD54HC/HCT163
54HCT
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Untitled
Abstract: No abstract text available
Text: High-Reliability High-Speed CMOS Logic ICs CD54HC139/3A CD54HCT139/3A Switching Speed Limits w ith black dots (• are tested 100%.) SWITCHING CHARACTERISTICS (CL ~ SO pF, Input t„ t, = 6 ns) LIMITS TEST CONDITIO NS CHARACTERISTIC SYMBOL Propagation Delay
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CD54HC139/3A
CD54HCT139/3A
CD54HC/HCT147
54HCT
2k-47k
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Untitled
Abstract: No abstract text available
Text: High-Reliability High-Speed CMOS Logic ICs CD54HC154/3A CD54HCT154/3A Switching Speed Limits with black dots (• are tested 100%.) SWITCHING CHARACTERISTICS (CL = 50 pF, Input tr, t, = 6 ns) TEST CONDITIO NS CHARACTERISTIC SYMBOL Propagation Delay Address to Outputs
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CD54HC154/3A
CD54HCT154/3A
54HCT
2k-47k
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Untitled
Abstract: No abstract text available
Text: High-Reliability High-Speed CMOS Logic ICs CD54HC174/3A CD54HCT174/3A Switching Speed Limits with black dots (• are tested 100%.) SWITCHING CHARACTERISTICS ( C l = 50 pF, Input t„ t, = 6 ns) LIMITS TEST CONDITIO NS CHARACTERISTIC SYMBOL Propagation Delay
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CD54HC174/3A
CD54HCT174/3A
CD54HC/HCT174
54HCT
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Untitled
Abstract: No abstract text available
Text: High-Reliability High-Speed CMOS Logic ICs CD54HC109/3A CD54HCT109/3A Switching Speed Lim its w ith black dots (• are tested 100%.) SWITCHING CHARACTERISTICS (CL = 50 pF, Input t, t, " 6 TEST CONDITIO NS
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CD54HC109/3A
CD54HCT109/3A
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54HC
Abstract: CD54HC221 CD54HCT221 hct195
Text: High-Reliability High-Speed C M O S Logic ICs CD54HC195/3A CD54HCT195/3 A Switching Sp66d L im its w ith b la ck dots (• are tested 100%.) SWITCHING CHARACTERISTICS (C L = 50 pF, Input t„ t, = 6 ns) LIMITS TEST 25 >C 55 C to +125°C CONDITIONS S4HCT
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CD54HC195/3A
CD54HCT195/3
54HCT
CD54HC/HCT221
CD54HC/HCT221
2k-47k
54HC
CD54HC221
CD54HCT221
hct195
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Untitled
Abstract: No abstract text available
Text: High-Reliability High-Speed C M O S Logic ICs _ 43D2271 DGES^flS 2 37E D HARRIS SEMICOND SECTOR CD54HC541/3A CD54HCT541/3A T ?S Z Switching Speed Limits with black dots (• are tested 100%.) S W IT C H IN G C H A R A C T E R IS T IC S (C l = 50 pF, Input t„ t, = 6 ns)
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43D2271
CD54HC541/3A
CD54HCT541/3A
2k-47k
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54hc binary counters
Abstract: 54HC CD54HC4020 CD54HCT4020
Text: High-Reliability High-Speed CMOS Logic ICs C D 54H C 4020/3A C D 54H C T4020/3A 14-Stage Binary Ripple Counter The RCA CD54HC4020 and CD54HCT4020 are 14-stage ripple-carry binary counters. All counter stages are master slave flip-flops. The state of the stage advances one count
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14-Stage
CD54HC4020/3A
CD54HCT4020/3A
CD54HC4020
CD54HCT4020
92CS-25053R4
360pA
54hc binary counters
54HC
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54HC
Abstract: CD54HC4024 CD54HCT4024 RCA 813
Text: High-Reliability High-Speed CMOS Logic ICs C D 54H C 4020/3A C D 54H C T4020/3A Burn-ln Test-Circuit Connections Static CD54HC/HCT4020 Dynamic CD54HC/HCT4020 OPEN 1-7,9,12-15 Use Static II fo r /3A burn-in and Dynam ic for Life Test. STATIC BURN-IN I GROUND
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CD54HC4020/3A
CD54HCT4020/3A
CD54HC/HCT4020
CD54HC/HCT4020
2k-47k
CD54HC4024/3A
CD54HCT4024/3A
CD54HC4024
CD54HCT4024
CD54HC/HCT4024
54HC
RCA 813
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74HCT533D
Abstract: 74HCT373D 74HCT573D CERAMIC LEADLESS CHIP CARRIER 54HCT373D 74HCT 74HCT373P 74HCT533P 74HCT563D 74HCT563P
Text: ^ Super tex inc. Octal D -T y p e Transparent Latches Ordering Information Package 20-pin plastic DIP 20-pin CERDIP 20-pin ceramic side-brazed DIP Outputs Military 54HCT Military Hi-Ral RB 54HCT N/A N/A Inverting Inverting Non-Inverting 7 4H C T 373P 74H C T 533P
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74HCT
54HCT
54HCT
20-pin
74HCT373P
74HCT533P
74HCT563P
74HCT573P
74HCT373D
74HCT533D
74HCT573D
CERAMIC LEADLESS CHIP CARRIER
54HCT373D
74HCT563D
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