M52777SP
Abstract: M54630P M38881M2 m59320 57704L M38173M6 SF15DXZ M34236 m37204m8 54630p
Text: REFERENCE LIST T ype Page 2 S A 1 115 2SA1235 2 SA1235A 149 2 SC2237 *★ 2SA1282 2SA1282A 103 2 S C 5 1 25 149 2 S C 5 1 68 150 2 SC2320 150 2 SC 2320L 149 2 SC2538 2SA1283 2SA1284 2SA1285 149 2S C 2 6 03 149 2S C 2 6 27 2SA1285A 149 2 SC2628 2SA1286 153 AS 30
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2SA1115
2SA1235
2SA1235A
2SA1282
2SA1282A
2SA1283
2SA1284
2SA1285
2SA1285A
2SA1286
M52777SP
M54630P
M38881M2
m59320
57704L
M38173M6
SF15DXZ
M34236
m37204m8
54630p
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HA11498
Abstract: TDA2640 HD7407P tda1060 TEA1009 KIA2206 TDA2591 tda2658 1V2 TUBE TDA3586
Text: Preface Welcome to the second edition of Television IC Data Files. Due to the falling price of consumer equipment, the first edition of this book, published in 1996, was conceived to help provide the repair engineer with a convenient, reliable source of information to aid speedy fault-finding. Not much has
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AN5071
AN5132
HPC4558
HA11498
TDA2640
HD7407P
tda1060
TEA1009
KIA2206
TDA2591
tda2658
1V2 TUBE
TDA3586
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26H4911
Abstract: S292P 51366SP
Text: VISHAY Vishay Telefunken Wafer Process Qualification Photo Detector Operating Life Test Description Device Type Duration Sample Size Failures Tamb = 25°C, V R = 5 V, IRA = 1.0 nA S292P 3 lots 2,000 h 150 Tamb = 100°C, V R = 5 V, IRA = 1.0 nA S292P 2,000 h
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S292P
S292P
H4898
26H4911
51366SP
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la7376
Abstract: STK5333 LB1807 LB1616 an6393 STK5352 LVA521 upc1473 TDA8501 m51316
Text: VCR IC Data Files VCR IC Data Files John Edwards % Newnes OXFORD BOSTON JOHANNESBURG MELBOURNE NEW DELHI SINGAPORE Butterworth-Heinemann Linacre House, Jordan Hill, Oxford 0X2 8DP 225 Wildwood Avenue, Woburn, MA 01801-2041 A division of Reed Educational and Professional Publishing Ltd
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