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30BQ100N Abstract: 10BQ100N SEN-R-964-K006 s314 K001 S314-100 SEN-R-830-K002 SEN-R-964-K007 MBR1045 12CWQ10FN Text: tSENSITRON SEMICONDUCTOR TECHNICAL DATA DATA SHEET 1192, REV. - Summary of Plastic Schottky Reliability Test Results Temperature Cycling Air to Air TLOW = -55 °C ; THIGH = +150 °C; tMIN @ EXTREMES = 15 minutes Device Type 61CNQ045 SPD165611 SEN-R-970 MBR1045	Original	PDF	61CNQ045 SPD165611 SEN-R-970 MBR1045 BAT54 30CPQ060 20CTQ045 18TQ045 12CWQ10FN 10MQ100N 30BQ100N 10BQ100N SEN-R-964-K006 s314 K001 S314-100 SEN-R-830-K002 SEN-R-964-K007 MBR1045 12CWQ10FN

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30BQ100N

Abstract: 10BQ100N SEN-R-964-K006 s314 K001 S314-100 SEN-R-830-K002 SEN-R-964-K007 MBR1045 12CWQ10FN
Text: tSENSITRON SEMICONDUCTOR TECHNICAL DATA DATA SHEET 1192, REV. - Summary of Plastic Schottky Reliability Test Results Temperature Cycling Air to Air TLOW = -55 °C ; THIGH = +150 °C; tMIN @ EXTREMES = 15 minutes Device Type 61CNQ045 SPD165611 SEN-R-970 MBR1045

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61CNQ045 SPD165611 SEN-R-970 MBR1045 BAT54 30CPQ060 20CTQ045 18TQ045 12CWQ10FN 10MQ100N 30BQ100N 10BQ100N SEN-R-964-K006 s314 K001 S314-100 SEN-R-830-K002 SEN-R-964-K007 MBR1045 12CWQ10FN