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    1H0132

    Abstract: 8S02 7H9749 9J0003 9H4501 0H1055-1 2E0215 49F8192 7J0202 7-H-97
    Text: PAGE 1 OF 8 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-49F8192A FLASH MEMORY RELIABILITY DATA - 150°C RETENTION BAKE (PLASTIC) - 125°C DYNAMIC LIFE TEST (PLASTIC) - 15 PSIG PRESSURE POT - EXTENDED TEMPERATURE CYCLING - 131°C/85% RELATIVE HUMIDITY HAST TEST


    Original     		PDF AT-49F8192A AT-49F8192A 7G4406-1 7S0029G 7H4713A 7S0170B 7T0048A 7J0202A 7J0202 7J2728 1H0132 8S02 7H9749 9J0003 9H4501 0H1055-1 2E0215 49F8192 7J0202 7-H-97

    M1014

    Abstract: K2078 1c9136 5D9602 AT27C010 AT27C512R 1C9133 27c256r 1A9110 3D9352
    Text: PAGE 1 OF 15 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C256R CMOS EPROM RELIABILITY DATA* * - 200°C DATA RETENTION BAKE - 125°C DYNAMIC OPERATING LIFE TEST - 125°C HIGH TEMPERATURE REVERSE BIAS (HTRB) - TEMPERATURE CYCLE, CENTRIFUGE, FINE AND GROSS


    Original     		PDF AT-27C256R from27C256R 4B0691 8703A) M1014 K2078 1c9136 5D9602 AT27C010 AT27C512R 1C9133 27c256r 1A9110 3D9352